Neslihan Kose, Anthony Rhodes, Umur Aybars Ciftci, Ilke Demir. Is It Certainly a Deepfake? Reliability Analysis in Detection & Generation Ecosystem. In IEEE/CVF International Conference on Computer Vision, ICCV 2025 - Workshops, Honolulu, HI, USA, October 19-20, 2025. pages 279-289, IEEE, 2025. [doi]
Abstract is missing.