Tackling long duration transients in sequential logic

Erol Koser, Walter Stechele. Tackling long duration transients in sequential logic. In 22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016. pages 137-142, IEEE, 2016. [doi]

@inproceedings{KoserS16,
  title = {Tackling long duration transients in sequential logic},
  author = {Erol Koser and Walter Stechele},
  year = {2016},
  doi = {10.1109/IOLTS.2016.7604687},
  url = {http://dx.doi.org/10.1109/IOLTS.2016.7604687},
  researchr = {https://researchr.org/publication/KoserS16},
  cites = {0},
  citedby = {0},
  pages = {137-142},
  booktitle = {22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016, Sant Feliu de Guixols, Spain, July 4-6, 2016},
  publisher = {IEEE},
  isbn = {978-1-5090-1507-8},
}