Panos Kotsampopoulos, Nikos D. Hatziargyriou, Benoit Bletterie, Georg Lauss, Thomas I. Strasser. Introduction of advanced testing procedures including PHIL for DG providing ancillary services. In IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013. pages 5398-5404, IEEE, 2013. [doi]
@inproceedings{KotsampopoulosH13,
title = {Introduction of advanced testing procedures including PHIL for DG providing ancillary services},
author = {Panos Kotsampopoulos and Nikos D. Hatziargyriou and Benoit Bletterie and Georg Lauss and Thomas I. Strasser},
year = {2013},
doi = {10.1109/IECON.2013.6700014},
url = {https://doi.org/10.1109/IECON.2013.6700014},
researchr = {https://researchr.org/publication/KotsampopoulosH13},
cites = {0},
citedby = {0},
pages = {5398-5404},
booktitle = {IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society, Vienna, Austria, November 10-13, 2013},
publisher = {IEEE},
}