Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster. Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures. IEEE T. Instrumentation and Measurement, 61(12):3198-3206, 2012. [doi]
Abstract is missing.