A. Ya. Koulibaba, A. Yu. Shtukarev, A. A. Sashoy, O. V. Yushin. Estimation of Storage Life of Electronic Components Based on Degradation Analysis. In 2018 IEEE East-West Design & Test Symposium, EWDTS 2018, Kazan, Russia, September 14-17, 2018. pages 1-4, IEEE, 2018. [doi]
No references recorded for this publication.
No citations of this publication recorded.