Bias Quantification for Protected Features in Pattern Classification Problems

Lisa Koutsoviti Koumeri, Gonzalo Nápoles. Bias Quantification for Protected Features in Pattern Classification Problems. In João Manuel R. S. Tavares, João Paulo Papa, Manuel González Hidalgo, editors, Progress in Pattern Recognition, Image Analysis, Computer Vision, and Applications - 25th Iberoamerican Congress, CIARP 2021, Porto, Portugal, May 10-13, 2021, Revised Selected Papers. Volume 12702 of Lecture Notes in Computer Science, pages 351-360, Springer, 2021. [doi]

Abstract

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