On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors

Dimitrios N. Kouvatsos. On-state and off-state stress-induced degradation in unhydrogenated solid phase crystallized polysilicon thin film transistors. Microelectronics Reliability, 42(12):1875-1882, 2002. [doi]

Abstract

Abstract is missing.