Ingrid Kovacs, Marina Topa, Monica Ene, Andi Buzo, Georg Pelz. A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits. In XXXV Conference on Design of Circuits and Integrated Systems, DCIS 2020, Segovia, Spain, November 18-20, 2020. pages 1-5, IEEE, 2020. [doi]
@inproceedings{KovacsTEBP20,
title = {A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits},
author = {Ingrid Kovacs and Marina Topa and Monica Ene and Andi Buzo and Georg Pelz},
year = {2020},
doi = {10.1109/DCIS51330.2020.9268659},
url = {https://doi.org/10.1109/DCIS51330.2020.9268659},
researchr = {https://researchr.org/publication/KovacsTEBP20},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {XXXV Conference on Design of Circuits and Integrated Systems, DCIS 2020, Segovia, Spain, November 18-20, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9132-4},
}