Ingrid Kovacs, Marina Topa, Monica Ene, Andi Buzo, Georg Pelz. A metamodel-based adaptive sampling approach for efficient failure region characterization of integrated circuits. In XXXV Conference on Design of Circuits and Integrated Systems, DCIS 2020, Segovia, Spain, November 18-20, 2020. pages 1-5, IEEE, 2020. [doi]
Abstract is missing.