The MCM s thermal testing

Vladimir A. Koval, Dmytro V. Fedasyuk. The MCM s thermal testing. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 266-271, IEEE Computer Society, 1996. [doi]

Authors

Vladimir A. Koval

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Dmytro V. Fedasyuk

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