Vladimir A. Koval, Dmytro V. Fedasyuk. The MCM s thermal testing. In 14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA. pages 266-271, IEEE Computer Society, 1996. [doi]
@inproceedings{KovalF96,
title = {The MCM s thermal testing},
author = {Vladimir A. Koval and Dmytro V. Fedasyuk},
year = {1996},
url = {http://csdl.computer.org/comp/proceedings/vts/1996/7304/00/73040266abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/KovalF96},
cites = {0},
citedby = {0},
pages = {266-271},
booktitle = {14th IEEE VLSI Test Symposium (VTS 96), April 28 - May 1, 1996, Princeton, NJ, USA},
publisher = {IEEE Computer Society},
}