M. Kozlov, G. Schaefers. Analysis of power deposition and temperature rise due to presence of an implant inside a 1.5 t MRI RF coil. In 37th Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2015, Milan, Italy, August 25-29, 2015. pages 5797-5800, IEEE, 2015. [doi]
Abstract is missing.