Improving the error behavior of DRAM by exploiting its Z-channel property - researchr publication authors

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Kira Kraft, Chirag Sudarshan, Deepak M. Mathew, Christian Weis, Norbert Wehn, Matthias Jung 0001. Improving the error behavior of DRAM by exploiting its Z-channel property. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 1492-1495, IEEE, 2018. [doi]

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