Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores - researchr publication authors

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Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian. Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 431-440, IEEE Computer Society, 2003. [doi]

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