Nektarios Kranitis, George Xenoulis, Antonis M. Paschalis, Dimitris Gizopoulos, Yervant Zorian. Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 431-440, IEEE Computer Society, 2003. [doi]
@inproceedings{KranitisXPGZ03,
title = {Application and Analysis of RT-Level Software-Based Self-Testing for Embedded Processor Cores},
author = {Nektarios Kranitis and George Xenoulis and Antonis M. Paschalis and Dimitris Gizopoulos and Yervant Zorian},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630431abs.htm},
tags = {embedded software, testing, analysis},
researchr = {https://researchr.org/publication/KranitisXPGZ03},
cites = {0},
citedby = {0},
pages = {431-440},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}