Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava. Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. In IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018. pages 3, IEEE, 2018. [doi]
@inproceedings{KranthiMMVS18,
title = {Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs},
author = {Nagothu Karmel Kranthi and Abhishek Mishra and Adil Meersha and Harsha B. Variar and Mayank Shrivastava},
year = {2018},
doi = {10.1109/IRPS.2018.8353571},
url = {https://doi.org/10.1109/IRPS.2018.8353571},
researchr = {https://researchr.org/publication/KranthiMMVS18},
cites = {0},
citedby = {0},
pages = {3},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018},
publisher = {IEEE},
isbn = {978-1-5386-5479-8},
}