Robert Krauthgamer, James R. Lee, Manor Mendel, Assaf Naor. Measured Descent: A New Embedding Method for Finite Metrics. In 45th Symposium on Foundations of Computer Science (FOCS 2004), 17-19 October 2004, Rome, Italy, Proceedings. pages 434-443, IEEE Computer Society, 2004. [doi]
Abstract is missing.