A nonmetric approach to measurement: an application to pattern representation

John G. Kreifeldt, Stephen H. Levine, Ming C. Chuang. A nonmetric approach to measurement: an application to pattern representation. In Proceedings of the IEEE International Conference on Systems, Man and Cybernetics, November 14-17, 1989, Cambridge, Massachusetts, USA. pages 812-817, IEEE, 1989. [doi]

Abstract

Abstract is missing.