An Ontology Design Pattern for Historical Metrological Practices

Christian Kremitzl, Christoph Schlieder, Werner Scheltjens. An Ontology Design Pattern for Historical Metrological Practices. In Vojtech Svátek, Valentina Anita Carriero, María Poveda-Villalón, Christian Kindermann, Lu Zhou 0005, editors, Proceedings of the 13th Workshop on Ontology Design and Patterns (WOP 2022) co-located with the 21th International Semantic Web Conference (ISWC 2022), Online, October 24, 2022. Volume 3352 of CEUR Workshop Proceedings, CEUR-WS.org, 2022. [doi]

Abstract

Abstract is missing.