Kannan Krishna, Stephen W. Director. A novel methodology for statistical parameter extraction. In Richard L. Rudell, editor, Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995. pages 696-699, IEEE Computer Society, 1995. [doi]
@inproceedings{KrishnaD95,
title = {A novel methodology for statistical parameter extraction},
author = {Kannan Krishna and Stephen W. Director},
year = {1995},
doi = {10.1145/224841.225146},
url = {http://doi.acm.org/10.1145/224841.225146},
researchr = {https://researchr.org/publication/KrishnaD95},
cites = {0},
citedby = {0},
pages = {696-699},
booktitle = {Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995, San Jose, California, USA, November 5-9, 1995},
editor = {Richard L. Rudell},
publisher = {IEEE Computer Society},
isbn = {0-8186-7213-7},
}