Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression

C. V. Krishna, Nur A. Touba. Reducing Test Dat Volume Using LFSR Reseeding with Seed Compression. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 321-330, IEEE Computer Society, 2002. [doi]

Authors

C. V. Krishna

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Nur A. Touba

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