Combining Error Masking and Error Detection Plus Recovery to Combat Soft Errors in Static CMOS Circuits

Srivathsan Krishnamohan, Nihar R. Mahapatra. Combining Error Masking and Error Detection Plus Recovery to Combat Soft Errors in Static CMOS Circuits. In 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June - 1 July 2005, Yokohama, Japan, Proceedings. pages 40-49, IEEE Computer Society, 2005. [doi]

Abstract

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