An Area Efficient Wide Range On-Chip Delay Measurement Architecture

Rahul Krishnamurthy, G. K. Sharma. An Area Efficient Wide Range On-Chip Delay Measurement Architecture. In Manoj Singh Gaur, Mark Zwolinski, Vijay Laxmi, Dharmendra Boolchandani, Virendra Singh, Adit D. Singh, editors, VLSI Design and Test, 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers. Volume 382 of Communications in Computer and Information Science, pages 49-58, Springer, 2013. [doi]

Abstract

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