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Series resistance degradation due to NBTI in PMOSFET

Mahesh S. Krishnan, Viktor Kol dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li. Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability, 42(9-11):1433-1438, 2002. [doi]

Authors

Mahesh S. Krishnan

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Viktor Kol dyaev

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Eiji Morifoji

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Koji Miyamoto

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Tomasz Brozek

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Xiaolei Li

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