Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Mahesh S. Krishnan, Viktor Kol dyaev, Eiji Morifoji, Koji Miyamoto, Tomasz Brozek, Xiaolei Li. Series resistance degradation due to NBTI in PMOSFET. Microelectronics Reliability, 42(9-11):1433-1438, 2002. [doi]
Abstract is missing.