Lakshmi Krishnan, Todd Snelson, Raymond Puffer, Daniel Walczyk. Durability studies of PBI-based membrane elect rode assemblies for high temperature PEMFCs. In IEEE Conference on Automation Science and Engineering, CASE 2010, Toronto, ON, Canada, 21-24 August, 2010. pages 21-26, IEEE, 2010. [doi]
Abstract is missing.