Thomas Kropf, Hans-Joachim Wunderlich. A Common Approach to Test Generation and Hardware Verification Based on Temporal Logic. In Proceedings IEEE International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991. pages 57-66, IEEE Computer Society, 1991.
No references recorded for this publication.
No citations of this publication recorded.