Testable Path Delay Fault Cover for Sequential Circuits

Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Cheng. Testable Path Delay Fault Cover for Sequential Circuits. J. Inf. Sci. Eng., 16(5):673-686, 2000. [doi]

Authors

Angela Krstic

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Srimat T. Chakradhar

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Kwang-Ting Cheng

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