Angela Krstic, Srimat T. Chakradhar, Kwang-Ting Cheng. Testable Path Delay Fault Cover for Sequential Circuits. J. Inf. Sci. Eng., 16(5):673-686, 2000. [doi]
@article{KrsticCC00,
title = {Testable Path Delay Fault Cover for Sequential Circuits},
author = {Angela Krstic and Srimat T. Chakradhar and Kwang-Ting Cheng},
year = {2000},
url = {http://www.iis.sinica.edu.tw/page/jise/2000/200009_01.html},
tags = {testing},
researchr = {https://researchr.org/publication/KrsticCC00},
cites = {0},
citedby = {0},
journal = {J. Inf. Sci. Eng.},
volume = {16},
number = {5},
pages = {673-686},
}