Design for Primitive Delay Fault Testability

Angela Krstic, Kwang-Ting Cheng, Srimat T. Chakradhar. Design for Primitive Delay Fault Testability. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 436-445, IEEE Computer Society, 1997.

@inproceedings{KrsticCC97,
  title = {Design for Primitive Delay Fault Testability},
  author = {Angela Krstic and Kwang-Ting Cheng and Srimat T. Chakradhar},
  year = {1997},
  tags = {testing, design},
  researchr = {https://researchr.org/publication/KrsticCC97},
  cites = {0},
  citedby = {0},
  pages = {436-445},
  booktitle = {Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997},
  publisher = {IEEE Computer Society},
  isbn = {0-7803-4209-7},
}