Jacob Krüger, Louis Nell, Wolfram Fenske, Gunter Saake, Thomas Leich. Finding Lost Features in Cloned Systems. In Maurice H. ter Beek, Walter Cazzola, Oscar Diaz, Marcello La Rosa, Roberto E. Lopez-Herrejon, Thomas Thüm, Javier Troya, Antonio Ruiz Cortés, David Benavides, editors, Proceedings of the 21st International Systems and Software Product Line Conference, SPLC 2017, Volume B, Sevilla, Spain, September 25-29, 2017. pages 65-72, ACM, 2017. [doi]
Abstract is missing.