A unified model for timing speculation: Evaluating the impact of technology scaling, CMOS design style, and fault recovery mechanism

Marc de Kruijf, Shuou Nomura, Karthikeyan Sankaralingam. A unified model for timing speculation: Evaluating the impact of technology scaling, CMOS design style, and fault recovery mechanism. In Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2010, Chicago, IL, USA, June 28 - July 1 2010. pages 487-496, IEEE, 2010. [doi]

@inproceedings{KruijfNS10-0,
  title = {A unified model for timing speculation: Evaluating the impact of technology scaling, CMOS design style, and fault recovery mechanism},
  author = {Marc de Kruijf and Shuou Nomura and Karthikeyan Sankaralingam},
  year = {2010},
  doi = {10.1109/DSN.2010.5544278},
  url = {http://dx.doi.org/10.1109/DSN.2010.5544278},
  tags = {design},
  researchr = {https://researchr.org/publication/KruijfNS10-0},
  cites = {0},
  citedby = {0},
  pages = {487-496},
  booktitle = {Proceedings of the 2010 IEEE/IFIP International Conference on Dependable Systems and Networks, DSN  2010, Chicago, IL, USA, June 28 - July 1 2010},
  publisher = {IEEE},
  isbn = {978-1-4244-7501-8},
}