A highly configurable test system for evolutionary black-box testing of embedded systems

Peter M. Kruse, Joachim Wegener, Stefan Wappler. A highly configurable test system for evolutionary black-box testing of embedded systems. In Franz Rothlauf, editor, Genetic and Evolutionary Computation Conference, GECCO 2009, Proceedings, Montreal, Québec, Canada, July 8-12, 2009. pages 1545-1552, ACM, 2009. [doi]

Abstract

Abstract is missing.