Krzysztof Kryszczuk, Andrzej Drygajlo. On Quality of Quality Measures for Classification. In Ben A. M. Schouten, Niels Christian Juul, Andrzej Drygajlo, Massimo Tistarelli, editors, Biometrics and Identity Management, First European Workshop, BIOID 2008, Roskilde, Denmark, May 7-9, 2008. Revised Selected Papers. Volume 5372 of Lecture Notes in Computer Science, pages 19-28, Springer, 2008. [doi]
Abstract is missing.