Aleksandra Krzyzanowska, Piotr Maj, Pawel Grybos, Robert Szczygiel, Anna Koziol. Methodology of automation process of wafer tests. In 22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015. pages 530-533, IEEE, 2015. [doi]
@inproceedings{KrzyzanowskaMGS15, title = {Methodology of automation process of wafer tests}, author = {Aleksandra Krzyzanowska and Piotr Maj and Pawel Grybos and Robert Szczygiel and Anna Koziol}, year = {2015}, doi = {10.1109/MIXDES.2015.7208579}, url = {http://dx.doi.org/10.1109/MIXDES.2015.7208579}, researchr = {https://researchr.org/publication/KrzyzanowskaMGS15}, cites = {0}, citedby = {0}, pages = {530-533}, booktitle = {22nd International Conference Mixed Design of Integrated Circuits & Systems, MIXDES 2015, Torun, Poland, June 25-27, 2015}, publisher = {IEEE}, isbn = {978-8-3635-7807-7}, }