Wai Kuan Yip, Lim Chun Chew, Wen-Jau Lee. Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing. In 2008 IEEE International Conference on Automation Science and Engineering, IEEE CASE 2008, Washington, DC, USA, August 23-26, 2008. pages 236-241, IEEE, 2008. [doi]
Abstract is missing.