Two-dimensional Technology Profiling of Patent Portfolio

Chung-Huei Kuan, Wei-Ming Tu, Dar-Zen Chen. Two-dimensional Technology Profiling of Patent Portfolio. In 2018 IEEE International Conference on Industrial Engineering and Engineering Management, IEEM 2018, Bangkok, Thailand, December 16-19, 2018. pages 1342-1347, IEEE, 2018. [doi]

Abstract

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