John R. Kuban, Bill Bruce. The MC6804P2 Built-In Self-Test. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 295-301, IEEE Computer Society, 1983.
@inproceedings{KubanB83,
title = {The MC6804P2 Built-In Self-Test},
author = {John R. Kuban and Bill Bruce},
year = {1983},
tags = {testing},
researchr = {https://researchr.org/publication/KubanB83},
cites = {0},
citedby = {0},
pages = {295-301},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}