Mineichi Kudo, Keigo Kimura, Michal Haindl, Hiroshi Tenmoto. Simultaneous visualization of samples, features and multi-labels. In 23rd International Conference on Pattern Recognition, ICPR 2016, Cancún, Mexico, December 4-8, 2016. pages 3603-3608, IEEE, 2016. [doi]
Abstract is missing.