Occurrence Prediction of Dislocation Regions in Photoluminescence Image of Multicrystalline Silicon Wafers Using Transfer Learning of Convolutional Neural Network - researchr publication

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Hiroaki Kudo, Tetsuya Matsumoto, Kentaro Kutsukake, Noritaka Usami. Occurrence Prediction of Dislocation Regions in Photoluminescence Image of Multicrystalline Silicon Wafers Using Transfer Learning of Convolutional Neural Network. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 104-A(6):857-865, 2021. [doi]

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