T. Kuenzig, G. Schrag, J. Iannacci. Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology. Microelectronics Reliability, 52(9-10):2235-2239, 2012. [doi]
@article{KuenzigSI12,
title = {Modeling and simulation of an active restoring mechanism for high reliability switches in RF-MEMS technology},
author = {T. Kuenzig and G. Schrag and J. Iannacci},
year = {2012},
doi = {10.1016/j.microrel.2012.06.137},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.137},
researchr = {https://researchr.org/publication/KuenzigSI12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {9-10},
pages = {2235-2239},
}