Model-based combined tracking and resolution enhancement

Annika Kuhl, Tele Tan, Svetha Venkatesh. Model-based combined tracking and resolution enhancement. In 19th International Conference on Pattern Recognition (ICPR 2008), December 8-11, 2008, Tampa, Florida, USA. pages 1-4, IEEE, 2008. [doi]

Authors

Annika Kuhl

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Tele Tan

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Svetha Venkatesh

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