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A Model for T-Way Fault Profile Evolution during Testing

D. Richard Kuhn, Raghu N. Kacker, Yu Lei. A Model for T-Way Fault Profile Evolution during Testing. In 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. pages 162-170, IEEE Computer Society, 2017. [doi]

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D. Richard Kuhn

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Raghu N. Kacker

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Yu Lei

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