D. Richard Kuhn, Raghu N. Kacker, Yu Lei. A Model for T-Way Fault Profile Evolution during Testing. In 2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017. pages 162-170, IEEE Computer Society, 2017. [doi]
@inproceedings{KuhnKL17,
title = {A Model for T-Way Fault Profile Evolution during Testing},
author = {D. Richard Kuhn and Raghu N. Kacker and Yu Lei},
year = {2017},
doi = {10.1109/ICSTW.2017.35},
url = {http://dx.doi.org/10.1109/ICSTW.2017.35},
researchr = {https://researchr.org/publication/KuhnKL17},
cites = {0},
citedby = {0},
pages = {162-170},
booktitle = {2017 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICST Workshops 2017, Tokyo, Japan, March 13-17, 2017},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-6676-6},
}