Gerald Kühne, Joachim Weickert, Markus Beier, Wolfgang Effelsberg. Fast Implicit Active Contour Models. In Luc J. Van Gool, editor, Pattern Recognition, 24th DAGM Symposium, Zurich, Switzerland, September 16-18, 2002, Proceedings. Volume 2449 of Lecture Notes in Computer Science, pages 133-140, Springer, 2002. [doi]
Abstract is missing.