Medha Kulkarni, Tom Chen. A sensitivity-based approach to analyzing signal delay uncertainty of coupled interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems, 24(9):1336-1346, 2005. [doi]
@article{KulkarniC05,
title = {A sensitivity-based approach to analyzing signal delay uncertainty of coupled interconnects},
author = {Medha Kulkarni and Tom Chen},
year = {2005},
doi = {10.1109/TCAD.2005.852059},
url = {http://dx.doi.org/10.1109/TCAD.2005.852059},
tags = {rule-based, systematic-approach},
researchr = {https://researchr.org/publication/KulkarniC05},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {24},
number = {9},
pages = {1336-1346},
}