Fine grain faults diagnosis of FPGA interconnect

T. Nandha Kumar, Haider A. F. Almurib, New Chin-Ee. Fine grain faults diagnosis of FPGA interconnect. Microprocessors and Microsystems, 37(1):33-40, 2013. [doi]

Authors

T. Nandha Kumar

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Haider A. F. Almurib

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New Chin-Ee

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