T. Nandha Kumar, Haider A. F. Almurib, New Chin-Ee. Fine grain faults diagnosis of FPGA interconnect. Microprocessors and Microsystems, 37(1):33-40, 2013. [doi]
@article{KumarAC13,
title = {Fine grain faults diagnosis of FPGA interconnect},
author = {T. Nandha Kumar and Haider A. F. Almurib and New Chin-Ee},
year = {2013},
doi = {10.1016/j.micpro.2012.08.006},
url = {http://dx.doi.org/10.1016/j.micpro.2012.08.006},
researchr = {https://researchr.org/publication/KumarAC13},
cites = {0},
citedby = {0},
journal = {Microprocessors and Microsystems},
volume = {37},
number = {1},
pages = {33-40},
}