Recruiting Fault Tolerance Techniques for Microprocessor Security

Vinay B. Y. Kumar, Suman Deb, Rupesh Kumar, Mustafa Khairallah, Anupam Chattopadhyay, Avi Mendelson. Recruiting Fault Tolerance Techniques for Microprocessor Security. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 80-85, IEEE, 2019. [doi]

Authors

Vinay B. Y. Kumar

This author has not been identified. Look up 'Vinay B. Y. Kumar' in Google

Suman Deb

This author has not been identified. Look up 'Suman Deb' in Google

Rupesh Kumar

This author has not been identified. Look up 'Rupesh Kumar' in Google

Mustafa Khairallah

This author has not been identified. Look up 'Mustafa Khairallah' in Google

Anupam Chattopadhyay

This author has not been identified. Look up 'Anupam Chattopadhyay' in Google

Avi Mendelson

This author has not been identified. Look up 'Avi Mendelson' in Google