Vinay B. Y. Kumar, Suman Deb, Rupesh Kumar, Mustafa Khairallah, Anupam Chattopadhyay, Avi Mendelson. Recruiting Fault Tolerance Techniques for Microprocessor Security. In 28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019. pages 80-85, IEEE, 2019. [doi]
@inproceedings{KumarDKKCM19,
title = {Recruiting Fault Tolerance Techniques for Microprocessor Security},
author = {Vinay B. Y. Kumar and Suman Deb and Rupesh Kumar and Mustafa Khairallah and Anupam Chattopadhyay and Avi Mendelson},
year = {2019},
doi = {10.1109/ATS47505.2019.00015},
url = {https://doi.org/10.1109/ATS47505.2019.00015},
researchr = {https://researchr.org/publication/KumarDKKCM19},
cites = {0},
citedby = {0},
pages = {80-85},
booktitle = {28th IEEE Asian Test Symposium, ATS 2019, Kolkata, India, December 10-13, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2695-1},
}